EDX-7000/8000/8100 - 規格

能量色散式 X-Ray 螢光光譜儀

型號 元素分析範圍 選配件
12樣品轉盤 真空 氦氣充填
EDX-7000 11Na to 92U O O O
EDX-8000 6C to 92U O O X
EDX-8100 6C to 92U O O O

Installation

Options

Vacuum measurement unit, helium purge unit, turret unit, screening analysis kits

Temperature

10 °C to 30 °C (temperature fluctuation rate 2 °C/hour max.,
temperature fluctuation range: 10 °C max.)

Relative humidity

40 % to 70 % (no condensation)

Power supply

100-240 V AC ±10 %, 2 A earthed socket

Dimensions

W 460 x D 590 x H 360 mm

重量

Approx. 45 kg

顯示更多
顯示較少

EDX-7000/8000/8100

Measurement principle

X-ray fluorescence spectrometry

Measurement method

Energy dispersion

Target samples

Solids, liquids, powders

Measuring range

11Na to 92U (EDX-7000) 6C to 92U (EDX-8000/8100)

Sample size

W 300 x D 275 x approx.H 100 mm (excluding radiuses)

Maximum sample mass

5kg (200g per sample when using turret, Gross mass 2.4kg)

顯示更多
顯示較少

X-ray generator

X-ray tube

Rh target

Voltage

4 kV to 50 kV

Current

1 μA to 1000 μA

Cooling method

Air-cooled (with fan)

Irradiated area

Automatic switching in four stages: 1, 3, 5, and 10 mm diameter
Automatic switching in four stages: 0.3, 1, 3, and 10 mm diameter*1

Primary filters

Five types (six, including the open position), automatic replacement

*1 Option for EDX-7000/8000/8100

顯示更多
顯示較少

Detector

Type

Silicon drift detector (SDD)

Liquid nitrogen

Not required (electronic cooling)

Sample chamber

Measurement atmosphere

Air, vacuum*1, helium (He)*2

Sample replacement*

12-sample turret

Sample observations

Semiconductor camera

*1 Option for EDX-7000/8000/8100
*2 Option for EDX-7000

Data processor

Memory

2 GB min. (32-bit), 4 GB min. (64-bit)

HDD

250 GB min.

OS

WindowsTM 10 (32-bit/64-bit)*

Software

Simple analysis software (PCEDX-Navi)
General analysis software (PCEDX-Pro)

* Microsoft Office is not included.

顯示更多
顯示較少

Software

Qualitative analysis

Measurement/analysis software

Quantitative analysis

Calibration curve method, correction for coexistent elements, FP method,film FP method, background FP method

Matching software

Intensity/content

Utilities

Automatic calibration functions (energy calibration, FWHM calibration)

Others

Instrument status monitoring function,
analysis results tabulation function

顯示更多
顯示較少
{"title":"\u898f\u683c\u6587\u4ef6\u4e0b\u8f09","description":"\u4e0b\u8f09\u6700\u65b0\u898f\u683c\u6587\u4ef6","source":"product","key":3380,"max":"30","filter_types":["spec_sheet"],"link_title":"View other Downloads","link_url":""} {"title":"\u4e0b\u8f09","description":"\u4e0b\u8f09\u6700\u65b0\u578b\u9304","source":"product","key":3380,"max":"30","filter_types":["brochures"],"link_title":"View other Downloads","link_url":"","pdf_links":[]}