Xslicer SMX-6010

SMX-6010 CT微焦點X射線透視檢查裝置

Xslicer SMX-6010

Xslicer SMX-6010 是一個平面 X 光檢測系統,具有微焦點 X 光發生器和 3 百萬畫素平面檢測器。
可提供具有寬動態範圍的高度準確影像,能夠詳細觀察內部結構和缺陷。
此外,系統可平順切換透視檢查和電腦斷層 (CT),進行符合樣品形狀的多種觀察。
這可支援多種樣品的檢測,包括改良小型化的電子零件,到具備進階高密度多層設計的安裝板。

特色

更多詳情
{"title":"\u4e0b\u8f09","description":"\u4e0b\u8f09\u6700\u65b0\u578b\u9304","source":"product","key":4633,"max":30,"filter_types":["brochures"],"link_title":"View other Downloads","link_url":"","pdf_links":[]} {"title":"\u61c9\u7528\u8cc7\u8a0a","source":"product","key":4633,"max":3,"filter_types":["applications","application_note","posters"],"link_title":"\u66f4\u591a\u8a73\u60c5","link_url":"\/products\/non-destructive-testing\/microfocus-x-ray-inspection-system\/xslicer-smx-6010\/applications.html","config_list":[],"page_links":[{"type":"page","link_title":"\u61c9\u7528","link_url":"\/products\/non-destructive-testing\/microfocus-x-ray-inspection-system\/xslicer-smx-6010\/applications.html#anchor_0","time":""}],"column_title":"Documents"} {"title":"\u6280\u8853\u6587\u4ef6","source":"product","key":4633,"max":3,"filter_types":["technical","technical_reports","white_papers","primers"],"link_title":"\u66f4\u591a\u8a73\u60c5","link_url":"\/products\/non-destructive-testing\/microfocus-x-ray-inspection-system\/xslicer-smx-6010\/applications.html#tbaleAnchor_technical","config_list":[],"page_links":[],"column_title":"Documents"} {"title":"\u8aaa\u660e\u624b\u518a","source":"product","key":4633,"max":3,"filter_types":["manuals"],"link_title":"\u66f4\u591a\u8a73\u60c5","link_url":"\/products\/non-destructive-testing\/microfocus-x-ray-inspection-system\/xslicer-smx-6010\/applications.html#tbaleAnchor_manual","config_list":[],"page_links":[],"column_title":"Documents"}